Name in English:
St IEC 60749-4:2017
Name in Russian:
Ст МЭК 60749-4:2017
Description in English:
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
Description in Russian:
Приборы полупроводниковые. Методы механических и климатических испытаний. Часть 4. Резко ускоренное стрессовое испытание (HAST) под воздействием влажного тепла в стационарном режиме
Document status:
Active
Format:
Electronic (PDF)
Page count:
14
Delivery time (for English version):
1 business day
Delivery time (for Russian version):
2 business days
SKU:
Stc003970
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