St IEC 60749-4:2017

St IEC 60749-4:2017

Name in English:
St IEC 60749-4:2017

Name in Russian:
Ст МЭК 60749-4:2017

Description in English:
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

Description in Russian:
Приборы полупроводниковые. Методы механических и климатических испытаний. Часть 4. Резко ускоренное стрессовое испытание (HAST) под воздействием влажного тепла в стационарном режиме

Document status:
Active

Format:
Electronic (PDF)

Page count:
14

Delivery time (for English version):
1 business day

Delivery time (for Russian version):
2 business days

SKU:
Stc003970

Choose Document Language:
$10
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