IEEE Std 1149.10-2017 PDF
Name in English:
St IEEE Std 1149.10-2017
Name in Russian:
Ст IEEE Std 1149.10-2017
Description in English:
IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture Original standard IEEE Std 1149.10-2017 in PDF full version. Additional info + preview on request
Description in Russian:
Стандарт IEEE на высокоскоростной порт доступа для тестирования и внутрикристальную архитектуру распределения Оригинальный стандарт IEEE Std 1149.10-2017 в PDF полная версия. Дополнительная инфо + превью по запросу
Document status:
Active
Format:
Electronic (PDF)
Page count:
96
Delivery time (for English version):
1 business day
Delivery time (for Russian version):
8 business days
SKU:
stieee001205
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