JIS H 0611-1971 (1983) PDF
Name in English:
St JIS H 0611-1971 (1983)
Name in Russian:
Ст JIS H 0611-1971 (1983)
Description in English:
Methods of Measurement of Thickness, Taper and Bow for Silicon Wafers Original standard JIS H 0611-1971 (1983) in PDF full version. Additional info + preview on request
Description in Russian:
Методы измерения толщины, клиновидности и прогиба кремниевых пластин Оригинальный стандарт JIS H 0611-1971 (1983) в PDF полная версия. Дополнительная инфо + превью по запросу
Document status:
Replaced by JIS H 0611-1994
Format:
Electronic (PDF)
Page count:
7
Delivery time (for English version):
1 business day
Delivery time (for Russian version):
2 business days
SKU:
stjis007226
More technical details are being prepared for this document.