VDI VDE 2630 Blatt-1-1 2016-11 PDF
Name in English:
STB VDI VDE 2630 Blatt-1-1 2016-11
Name in Russian:
STB VDI VDE 2630 Blatt-1-1 2016-11
Original standard VDI VDE 2630 Blatt-1-1 2016-11 in PDF full version. Additional info + preview on request
Full title and description
STB VDI VDE 2630 Blatt-1-1:2016-11 — Computertomografie in der dimensionellen Messtechnik / Computed tomography in dimensional measurement. This guideline defines the fundamentals and terminology for industrial computed tomography (CT) when used for dimensional measurement of parts (lengths, angles, features) and provides indexed definitions across topics such as radiation sources, detectors, scan parameters, image reconstruction, artefacts and dimensional measuring.
Abstract
The document establishes agreed terms and basic concepts required for applying CT in dimensional metrology. It supplies clear definitions, descriptions and, where needed, associated symbols; organises terms by subject area (general terms, sources, detectors, acquisition parameters, reconstruction, artefacts, dimensional measurement) and includes an index for fast lookup. The main focus is on CT used for dimensional measurement in industrial environments.
General information
- Status: Current / Active
- Publication date: 2016-11 (1 November 2016)
- Publisher: Verlag des Vereins Deutscher Ingenieure (VDI/VDE)
- ICS / categories: 01.040.19; 01.040.35; 19.100; 35.240.99
- Edition / version: Blatt 1.1 (2016-11)
- Number of pages: 32
Scope
The guideline covers terminology, fundamental concepts and definitions necessary for the application of computed tomography to dimensional measurement. It is intended to harmonise language and basic understanding across manufacturers, inspection laboratories and users of CT-based metrology so that measurement reports, procedures and method descriptions use consistent definitions. The scope emphasises dimensional CT (metrology of geometry and sizes) but the defined terms are transferable to other CT application areas.
Key topics and requirements
- Standardised vocabulary for industrial CT: general terms and definitions for components and processes.
- Definitions and characteristics of radiation sources and detectors used in CT systems.
- Acquisition/scan parameters and recommended ways to describe them for reproducible measurements.
- Image reconstruction terminology and brief methodological descriptions relevant to dimensional results.
- Identification and definition of common CT artefacts and their implications for dimensional measurement.
- Terminology and descriptors used when reporting dimensional CT measurement results, including formula symbols where applicable.
Typical use and users
Metrology laboratories, OEM quality and inspection teams, CT system manufacturers, measurement service providers, research groups working on non‑destructive testing and dimensional verification, and engineers preparing measurement procedures or acceptance reports will use this guideline as a common reference for terms and basic CT metrology concepts.
Related standards
VDI/VDE 2630 is a multi‑part series; related parts address influencing variables on measurement results, determination of measurement uncertainty for CT-based coordinate measurement systems, simulation‑based uncertainty determination and other practical guidance for dimensional CT. Users commonly consult nearby parts of the 2630 series together with broader VDI/VDE metrology guidelines when defining procedures and demonstrating measurement capability.
Keywords
computed tomography; CT; dimensional measurement; metrology; terminology; radiation source; detector; image reconstruction; artefacts; VDI/VDE 2630; measurement uncertainty.
FAQ
Q: What is this standard?
A: It is VDI/VDE 2630 Blatt 1.1 (2016-11), a guideline that defines fundamentals and standard terminology for using computed tomography in dimensional metrology.
Q: What does it cover?
A: It covers agreed terms and basic concepts relevant to CT-based dimensional measurement: general vocabulary, source/detector descriptions, acquisition parameters, reconstruction terminology, artefacts and how dimensional measurement results are described.
Q: Who typically uses it?
A: Metrology labs, quality/inspection engineers, CT vendors, measurement service companies, researchers and anyone producing or interpreting dimensional CT measurement results.
Q: Is it current or superseded?
A: The 2016-11 edition (Blatt 1.1:2016-11) is the current published edition of this part; it superseded earlier versions (the guideline history includes prior editions such as 2009). Users should verify any later confirmations or updates from VDI/VDE if a newer edition or corrigenda have been issued since 2016.
Q: Is it part of a series?
A: Yes — VDI/VDE 2630 is a multi-part guideline series covering computed tomography in dimensional metrology. Other parts cover influencing factors, uncertainty evaluation (including simulation approaches), and practical measurement guidance; these are commonly used together for a complete metrology workflow.
Q: What are the key keywords?
A: Computed tomography, dimensional measurement, CT metrology, reconstruction, artefacts, radiation detector, measurement uncertainty, VDI/VDE 2630.