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Semiconductor devices. Mechanical and climatic test methods - Mechanical shock. device and subassembly. Original standard BS EN IEC 60749-10-2022 in PDF full version. Additional info + preview on request

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Semiconductor devices. Mechanical and climatic test methods - Vibration, variable frequency. Original standard BS EN IEC 60749-12-2018 in PDF full version. Additional info + preview on request

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Semiconductor devices. Mechanical and climatic test methods - Salt atmosphere. Original standard BS EN IEC 60749-13-2018 in PDF full version. Additional info + preview on request

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Semiconductor devices. Mechanical and climatic test methods - Resistance to soldering temperature for through-hole mounted devices. Original standard BS EN IEC 60749-15-2020 in PDF full version. Additional info + preview on request

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Semiconductor devices. Mechanical and climatic test methods - Neutron irradiation. Original standard BS EN IEC 60749-17-2019 in PDF full version. Additional info + preview on request

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Semiconductor devices. Mechanical and climatic test methods - Ionizing radiation (total dose). Original standard BS EN IEC 60749-18-2019 in PDF full version. Additional info + preview on request

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