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Semiconductor devices. Mechanical and climatic test methods - Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat. Original standard BS EN IEC 60749-20-2020 in PDF full version. Additional info + preview on request

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Semiconductor devices. Mechanical and climatic test methods - Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM). Original standard BS EN IEC 60749-26-2018 in PDF full version. Additional info + preview on request

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Semiconductor devices. Mechanical and climatic test methods - Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). device level. Original standard BS EN IEC 60749-28-2022 in PDF full version. Additional info + preview on request

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Semiconductor devices. Mechanical and climatic test methods - Preconditioning of non-hermetic surface mount devices prior to reliability testing. Original standard BS EN IEC 60749-30-2020 in PDF full version. Additional info + preview on request

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Semiconductor devices. Mechanical and climatic test methods - Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components. Original standard BS EN IEC 60749-39-2022 in PDF full version. Additional info + preview on request

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Semiconductor devices. Mechanical and climatic test methods - Standard reliability testing methods of non-volatile memory devices. Original standard BS EN IEC 60749-41-2020 in PDF full version. Additional info + preview on request

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