TDS PDF

IEEE Standard for Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architecture Original standard IEEE Std 1149.7-2022 in PDF full version. Additional info + preview on request

Document status: Active

IEEE Standard for Boundary-Scan-Based Stimulus of Interconnections to Passive and/or Active Components Original standard IEEE Std 1149.8.1-2012 in PDF full version. Additional info + preview on request

Document status: Withdrawn

IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture Original standard IEEE Std 1149.10-2017 in PDF full version. Additional info + preview on request

Document status: Active

IEEE Recommended Practice for Integrating Power Plant Computer-Aided Engineering (CAE) Applications Original standard IEEE Std 1150-1991 in PDF full version. Additional info + preview on request

Document status: Withdrawn

IEEE Standard for Programmed Inquiry, Learning, or Teaching (PILOT) Original standard IEEE Std 1154-1991 in PDF full version. Additional info + preview on request

Document status: Withdrawn

IEEE Standard for VMEbus Extensions for Instrumentation- VXIbus Original standard IEEE Std 1155-1992 in PDF full version. Additional info + preview on request

Document status: Withdrawn